1. Advanced electron microscopy and nanomaterials
پدیدآورنده : / Arturo Ponce and Dario Bueno
کتابخانه: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
موضوع : Electron microscopy,Nanostructured materials
رده :
TA
418
.
9
.
N35A3275
2010
2. Advanced electron microscopy and nanomaterials: selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials )AEM-NANOMAT '09(, Saltillo )Coahuila( Me۱جxico, September 29th-October 2nd, 2009
پدیدآورنده : edited by: Arturo Ponce and Dario Bueno
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Congresses ، Electron microscopy,Congresses ، Nanostructured materials
رده :
TA
418
.
9
.
N35
A3275
2010
3. Advanced transmission electron microscopy
پدیدآورنده : / Jian Min Zuo, John C.H. Spence
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Transmission electron microscopy.,Materials science.,Nanochemistry.,Solid state physics.,Nanoscience.,Nanostructures.,Nanotechnology.
رده :
TA404
.
6
.
Z88
2017
4. Advanced transmission electron microscopy
پدیدآورنده : / Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal, editors
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Transmission electron microscopy.,Nanostructured materials--Nondestructive testing
رده :
QH212
.
T7A39
2015
5. Analytical electron microscopy for materials science
پدیدآورنده : Shindo D. )Daisuke(
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Materials-- Microscopy,، Electron microscopy
رده :
TA
417
.
23
.
S5513
2002
6. Atlas of backscattering Kikuchi diffraction patterns
پدیدآورنده : Dingley, David J.
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Materials - Microscopy , Scanning electron microscopy , Diffraction patterns , Crystallography
رده :
TA
417
.
23
.
D56
7. Atlas of backscattering Kikuchi diffraction patterns
پدیدآورنده : / D.J. Dingley, K.Z. Baba-Kishi, V. Randle
کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)
موضوع : Materials--Microscopy,Scanning electron microscopy.,Diffraction patterns.,Crystallography.
رده :
TA
,
417
.
23
,.
D56
,
1995
8. Characterization of microstructures by analytical electron microscopy (AEM)
پدیدآورنده : / Yonghua Rong
کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
موضوع : Nanostructured materials - Nondestructive testing,Electron microscopy
رده :
TA417
.
23
.
R66
2012
9. Electron Microscopy and Multiscale Modeling: Proceedings of The EMMM-2007 International Conference
پدیدآورنده :
کتابخانه: Library of Islamic Azad University, Qom branch (Qom)
موضوع : Materials- Microscopy- Congresses,Electron microscopy- Congresses
رده :
TA
.
E426
417
.
23
2007
10. Electron backscatter diffraction in materials science
پدیدآورنده : edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams
موضوع : ، Materials, Microscopy,، Scanning electron microscopy,، Crystallography
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
11. Electron backscatter diffraction in materials science
پدیدآورنده :
کتابخانه: Central Library and Document Center of Arak University (Markazi)
موضوع : Materials -- Microscopy,Electrons -- Backscattering,Electrons -- Diffraction,Scanning electron microscopy
رده :
620
.
11299
E38
12. Electron backscatter diffraction in materials science
پدیدآورنده : / Adam J. Schwartz ... [et al.], eds
کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)
موضوع : Materials--Microscopy,Scanning electron microscopy.,Crystallography.,Elektronenbeugung.--swd,Kristallographie.--swd,Reuckstreuung.--swd
رده :
TA
,
417
.
23
,.
E419
,
2009
13. Electron backscatter diffraction in materials science
پدیدآورنده : / Adam J. Schwartz ... [et al.], eds
کتابخانه: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
موضوع : Materials -- Microscopy,Scanning electron microscopy,Crystallography,Elektronenbeugung,Kristallographie.,Rèuckstreuung.
رده :
TA
417
.
23
.
E419
2009
14. Electron backscatter diffraction in materials science
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Materials ; Microscopy. ; Scanning electron microscopy. ; Crystallography. ; Elektronenbeugung. ; swd. ; Kristallographie. ; swd. ; R?ckstreuung. ; swd. ;
15. Electron backscatter diffraction in materials science
پدیدآورنده :
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Materials- Microscopy,Scanning electron microscopy,Crystallography
رده :
TA417
.
23
.
E419
2000
16. Electron beam analysis of materials
پدیدآورنده : Loretto, M. H.
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Materials - Analysis , Electron beams - Industrial applications , Electron microscopy
رده :
TA
417
.
23
.
L67
1994
17. Electron beam analysis of materials
پدیدآورنده : Loretto, M. H.
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Analysis ، Materials,Industrial applications ، Electron beams,، Electron microscopy
رده :
TA
417
.
23
.
L67
1994
18. Electron beam analysis of materials
پدیدآورنده : / M.H. Loretto
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Materials- Analysis,Electron beams- Industrial applictions,Electron microscopy
رده :
TA417
.
23
.
L67
1994
19. Electron beam analysis of materials
پدیدآورنده : / M.H. Loretto
کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)
موضوع : Materials- Analysis,Electron beams- Industrial applications,Electron microscopy
رده :
TA417
.
23
.
L67
1994
20. Electron beam analysis of materials
پدیدآورنده : Loretto, M. H.
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Materials- Analysis,، Electron beams- Industrial applications,، Electron microscopy
رده :
TA
417
.
23
.
L67
1994
